pSemiUnited States
Designed specifically to support the requirements of the test equipment and ATE market. It is comprised of four symmetric RF ports
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View full reportTechnical parameters
| Power | |
|---|---|
| Max Power Rating (dBm) | 30 |
| Environment and package | |
| Max Temp (ºC) | 85 |
| Package | 32L LGA |
| Package (mm) | 5x5 |
| Other | |
| Description | SP4T (A) |
| ECCN | EAR99 |
| ESD HBM (V) | 2000 |
| IIP3 (dBm) | 58 |
| Max Freq. | 8 GHz |
| Max Typ. IL (dB) | 1.2 |
| Min Freq. | 10 Hz |
| Min Typ. Iso (dB) | 27 |
| P1dB/P0.1dB (dBm) | 33.0 / – |
| PCN/EOL | PCN – August 31, 2021: Manufacturing Site, Ordering codes change PCN – September 14, 2018: Electrical Test – location change, Manufacturing Site – assembly site change, Ordering codes change PCN – November 17, 2017: Wafer Fabrication Process, Ordering codes change PCN – February 15, 2017: Assembly Process – New package laminate, Ordering codes change |
| Switching Time | 5 µs |
| Typ. IL (dB) | 0.7 |
| Typ. Iso (dB) | 84 |
| VDD Range (V) | 3.0–3.6 |
Documents
DatasheetDatasheet · 1.5 MB · 2026-09-23Application NoteApplication Note · 3.3 MB · 2026-09-23Quality & ReliabilityQuality & Reliability · 1.9 MB · 2026-09-23Quality & ReliabilityQuality & Reliability · 774.8 KB · 2026-09-23Application NoteApplication Note · 693.9 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 145.8 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 141.0 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 129.2 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 75.4 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 53.6 KB · 2026-09-23Quality & ReliabilityQuality & Reliability · 41.7 KB · 2026-09-23User ManualUser Manual · 32.0 KB · 2026-09-23
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